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Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

atto sense and switch unit (ASU)

Semiconductors; Test equipment

A special module that works with a high resolution SMU to obtain current measurement resolution of 0.1 fA. The ASU also has a switching capability that allows it to switch between ...

automatic (automated) test equipment (ATE)

Semiconductors; Test equipment

A collection of stimulus, measuring and switching equipment where the control and decision processes are performed by a computer that is typically preprogrammed to test a ...

abbreviated test language for all systems (ATLAS)

Semiconductors; Test equipment

A standard test programming language developed by the IEEE and maintained under various standards, such as IEE Std. 416 and 716. ATLAS 2000 also exists.

automatic test markup language (ATML)

Semiconductors; Test equipment

ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, ...

american wire gage (AWG)

Semiconductors; Test equipment

A gauge that assigns a number value to the diameter of a wire.

arbitrary waveform generator (AWG)

Semiconductors; Test equipment

An *Arb* often uses a real-world signal, previously captured by a digital oscilloscope, as the starting point to create a single-cycle waveform.

magnetic flux density (B)

Semiconductors; Test equipment

Tesla (T) = 1 weber/m2 = 104 gauss. 1 gauss = 1 line/cm2 = 1 maxwell/cm2 = 7.936 x 105 A/m.