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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment
basic input/output system (BIOS)
Semiconductors; Test equipment
BIOS functions are the fundamental level of any PC or compatible computer. BIOS functions embody the basic operations needed for successful use of the computer’s hardware ...
built-In repair analysis (BIRA)
Semiconductors; Test equipment
Technique used to determine if a memory is repairable and the repair information based on the specified redundancy scheme, i.e., spare IO or column, or spare row.
build-in self analysis (BISA)
Semiconductors; Test equipment
A method related to Built-in Self Repair (BISR) that processes memory failure data to generate repair data.
built-In self repair (BISR)
Semiconductors; Test equipment
A memory repair method that goes beyond diagnostics to actually repair the device through redundancy selection when defects are detected.
built In test (BIT)
Semiconductors; Test equipment
An integral capability of the mission system or equipment which provides an automated test capability to detect, diagnose or isolate failures.
built-In test (BIT)
Semiconductors; Test equipment
An internal automatic or semiautomatic feature in a system or subsystem designed to detect, diagnose or isolate system failures by interrogating a system or monitoring system ...
built In test equipment (BITE)
Semiconductors; Test equipment
A permanently mounted device that is used expressly for testing an equipment or system.
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)