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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment
bipolar junction transistor (BJT)
Semiconductors; Test equipment
A three terminal device in which emitter to collector current is controlled by base current.
board level self-test (BLST)
Semiconductors; Test equipment
A form of BIT or BIST specifically targeting the functionality of the board in which the BLST resides.
bill of material (BOM)
Semiconductors; Test equipment
comprehensive listing of all subassemblies, components, and raw materials that go into a parent assembly, showing the quantity of each required to make the assembly.
beacon period occupancy information element (BPOIE)
Semiconductors; Test equipment
Contained in the payload of every beacon frame, the BPOIE reports the BP length and status of individual slots as seen by the device transmitting the frame. The slot info bitmap ...
bits per second (BPS)
Semiconductors; Test equipment
Used to denote the speed of data transfer. Used interchangable with "baud" in most cases.
basic rate interface (BRI)
Semiconductors; Test equipment
Basic Rate ISDN. Services targeted at home and small business users. BRI service is delivered over a single twisted pair, the same wiring that is used to deliver POTS. It includes ...
boundary-scan (BScan)
Semiconductors; Test equipment
The use of a serial scan-shift register called the Boundary-Scan Register (BSR) to provide controllability and observability of device I/O pins.
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)