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Test equipment
Industry: Semiconductors
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Test equipment
clock data and recovery (CDR)
Semiconductors; Test equipment
Some digital data streams, especially high-speed serial data streams (such as the raw stream of data from the magnetic head of a disk drive) are sent without an accompanying clock. The receiver ...
Comité Européen de Normalisation Electrotechnique (CENELEC)
Semiconductors; Test equipment
Comité Européen de Normalisation Electrotechnique (European Committee for Electrotechnical Standardization), located in Brussels, in charge of harmonizing electro-technical standards in the frame of ...
CAD framework initiative (CFI)
Semiconductors; Test equipment
A consortium of EDA tool companies tasked with the development of framework standards for EDA tools.
column grid array (CGA)
Semiconductors; Test equipment
A packaging technology similar to a pad grid array, in which a device's external connections are arranged as an array of conducting pads on the base of the package. However, in the case of a column ...
complex instruction set computer (CISC)
Semiconductors; Test equipment
A design approach for microprocessors and microcontrollers which employs relatively complex instructions that execute over multiple clock cycles. A program written using CISC instructions requires ...
circuit mil area (CMA)
Semiconductors; Test equipment
A unit of area equal to the area of a circle whose diameter is one mil (0.001 inch). Used chiefly in specifying cross-sectional areas of conductors.
component maturity model integration (CMMI)
Semiconductors; Test equipment
A software development standard spearheaded by the Department of Defense (DoD) to improve the quality of the software developed by its contractors.
