Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

direct current (DC)

Semiconductors; Test equipment

Current flow in only one direction (as opposed to alternating current or AC when current flows both forward and backward).

data circuit-terminating equipment (DCE)

Semiconductors; Test equipment

In a data station, the equipment that performs functions, such as signal conversion and coding, at the network end of the line between the data terminal equipment (DTE) and the line, and that may be ...

dynamic channel multicarrier architecture (DCMA)

Semiconductors; Test equipment

A technology developed by ComSpace Corp. used for specialized mobile radio networks that can configure the number and bandwidth of voice and data channels based on a carrier's requirements.

double data rate synchrounous dynamic random accses memory (DDR SDRAM)

Semiconductors; Test equipment

That can theoretically improve memory clock speed to at least 200 MHz*. It activates output on both the rising and falling edge of the system clock rather than on just the rising edge, potentially ...

double data rate (DDR)

Semiconductors; Test equipment

A type of SDRAM that delivers data at double the rate for a given clock frequency. The bandwidth in a PC of DDR PC266 parts with 64-bit bus using a 133MHz clock is over 2 GBytes/second.

direct digital synthesizer (DDS)

Semiconductors; Test equipment

Technology that synthesizes waveforms by using a single clock frequency to spawn any frequency within the instrument’s range; determines the rate at which samples are clocked out of a signal ...