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Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

clock data and recovery (CDR)

Semiconductors; Test equipment

Some digital data streams, especially high-speed serial data streams (such as the raw stream of data from the magnetic head of a disk drive) are sent without an accompanying ...

Comité Européen de Normalisation Electrotechnique (CENELEC)

Semiconductors; Test equipment

Comité Européen de Normalisation Electrotechnique (European Committee for Electrotechnical Standardization), located in Brussels, in charge of harmonizing electro-technical ...

CAD framework initiative (CFI)

Semiconductors; Test equipment

A consortium of EDA tool companies tasked with the development of framework standards for EDA tools.

column grid array (CGA)

Semiconductors; Test equipment

A packaging technology similar to a pad grid array, in which a device's external connections are arranged as an array of conducting pads on the base of the package. However, in ...

complex instruction set computer (CISC)

Semiconductors; Test equipment

A design approach for microprocessors and microcontrollers which employs relatively complex instructions that execute over multiple clock cycles. A program written using CISC ...

circuit mil area (CMA)

Semiconductors; Test equipment

A unit of area equal to the area of a circle whose diameter is one mil (0.001 inch). Used chiefly in specifying cross-sectional areas of conductors.

component maturity model integration (CMMI)

Semiconductors; Test equipment

A software development standard spearheaded by the Department of Defense (DoD) to improve the quality of the software developed by its contractors.