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Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

complementary metal oxide semiconductor (CMOS)

Semiconductors; Test equipment

A family of integrated circuits characterized by low power consumption.

common mode rejection ratio (CMRR)

Semiconductors; Test equipment

A measure of an instrument's ability to ignore or reject interference from a signal that is common to the instrument's input terminals, but relative to ground. (Expressed in ...

chip mount technology (CMT)

Semiconductors; Test equipment

Any packaging or electronic assembly manufacturing technology, such as TOB, COB, or flip chip, that connects bare (unpackaged) IC chips to the substrate.

capacitance measurement unit (CMU)

Semiconductors; Test equipment

This is a very generic term covering any sort of hardware that can perform capacitance measurement.

cannot duplicate (CND)

Semiconductors; Test equipment

A fault indicated by BIT or other monitoring circuitry which cannot be confirmed at the first level of maintenance.

chip on board (COB)

Semiconductors; Test equipment

A configuration in which a chip is directly attached to a printed circuit board or substrate by solder or conductive adhesives.

chip-on-board (COB)

Semiconductors; Test equipment

A situation where the silicon IC chip is mounted directly to the electronic assembly substrate or PWB without an intermediate packaging step. Connections between the chip and the ...