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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment
mean time between critical failure (MTBCF)
Semiconductors; Test equipment
The mean time between failures of mission-essential functions, calculated as the ratio of active hours (those excluding scheduled maintenance) and the number of critical failures.
mean time between downing events (MTBDE)
Semiconductors; Test equipment
A measure calculated as the total uptime over the number of downing events.
mean-time-between-failure (MTBF)
Semiconductors; Test equipment
The arithmetic or statistical mean average time interval, usually in hours, that may be expected between failures of an operating unit. Results should be designated actual, ...
mean time between maintenance actions (MTBMA)
Semiconductors; Test equipment
A ratio of the total uptime over the number of scheduled and unscheduled maintenance events.
mean time between preventative maintenance (MTBPM)
Semiconductors; Test equipment
A ratio of the total uptime over the number of preventative maintenance events.
mean time between scheduled maintenance (MTBSM)
Semiconductors; Test equipment
A ratio of the total uptime over the number of scheduled maintenance events.
mean time between unscheduled maintenance (MTBUM)
Semiconductors; Test equipment
A ratio of the total uptime over the number of unscheduled maintenance events.
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
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- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
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- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)