Semiconductors

Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

alias frequency

Semiconductors; Test equipment

A false lower-frequency component that appears in analog data that is reconstructed from original data digitized at an insufficiently high sampling rate.

asynchronous transfer mode (ATM)

Semiconductors; Test equipment

A fast-packet switching technology that uses asynchronous time-division multiplexing.

fault dictionary

Semiconductors; Test equipment

A fault dictionary contains the same information contained in a fault list, but include information about how the fault manifests itself including the error location and its ...

non-observable fault

Semiconductors; Test equipment

A fault is considered non-observable if its effects cannot be measured at any network output.

fault list

Semiconductors; Test equipment

A fault list that contains every possible fault for consideration, but no information bout how the fault manifests itself under various circuit conditions and test conditions.