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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors; Test equipment
DFT technique where traditional functional logic is reconfigured into "chains" for direct test access to internal nodes.
fault dominance
Semiconductors; Test equipment
Dominance is the condition in which the deviation at the output caused by one fault is negligible compare with the deviation at the same output, but caused by a different fault.
conducted emission
Semiconductors; Test equipment
Electromagnetic energy that is propagated along a conductor. This energy is called "conducted interference" if it is undesired.
electronic design automation (EDA)
Semiconductors; Test equipment
EDA refers to the design tools and environment utilized to render the logic, schematics, insert scan, insert BIST, etc. for a new chip design.
P1500
Semiconductors; Test equipment
Emerging IEEE standard for test wrappers (common -scan like test structures "wrapped around SOC cores).
genlock
Semiconductors; Test equipment
Extraction of horizontal-sync and vertical-sync signals from a video signal and the use of those signals to synchronize video equipment.
transition delay
Semiconductors; Test equipment
Fault characterized by a particular gate or gate connection being too slow-to-rise or too slow-to-fall to meet the overall timing requirements of a circuit.
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- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
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- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
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- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)