Semiconductors

Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

14Categories 15407Terms

Add a new term

Contributors in Semiconductors

Become a Contributors

Semiconductors > Test equipment

path delay

Semiconductors; Test equipment

Fault characterized by a particular logic path being too slow to meet the overall timing requirements of a circuit.

AC Scan

Semiconductors; Test equipment

Form of scan test application, where only the sample interval is required at the specified operating frequency in order to verify timing performance, as well as structural ...

at-speed scan

Semiconductors; Test equipment

Form of scan where both the data shift and sample occur at the rated frequency of operation. Structure and timing performance can both be verified with this kind of scan test.

DC scan

Semiconductors; Test equipment

Form of scan where shifting and sampling occurs well below the devices normal operating frequency. This type of scan is effective for a 'pure' structural approach (i.e. for ...

data acquisition (DAQ)

Semiconductors; Test equipment

Gathering information from sources such as sensors and transducers.

boundary scan

Semiconductors; Test equipment

Generic term for IEEE 1149.1. It is a methodology allowing complete controllability and observability of the boundary (I/O) pins via a standard interface. (AKA JTAG)