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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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averaging
Semiconductors; Test equipment
Mathematically smoothing the results of several measurements by adding them and dividing by the number of samples.
cross modulation
Semiconductors; Test equipment
Modulation of a desired signal by an undesired signal. This is a special case of inter modulation.
joint test action group (JTAG)
Semiconductors; Test equipment
Originally, the name of the team, through a not uncommon twist of fate, the term has come to be associated with the output of the team. JTAG is now essentially synonymous with the ...
file name
Semiconductors; Test equipment
Part of the identification used to locate a file on a volume.
test access port (TAP)
Semiconductors; Test equipment
Part of the JTAG standard, the TAP is a 4 (or optionally 5) pin port to enable boundary scan.
concurrent test
Semiconductors; Test equipment
Performing different tests simultaneously to one or more devices. For instance, you might be testing different BIST circuits simultaneously on the same chip. Alternatively, you ...
primary input
Semiconductors; Test equipment
Physical input from the outside world to a device, can be a signal input, a scan chain input, etc. (Note: In the case of cores in an SOC, the outside world may still be inside the ...
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- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
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- Integrated circuit (515)
- Process equipment (48)
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