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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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stimulus
Semiconductors; Test equipment
An input signal which imitates action or reaction in a circuit, such as voltage or current.
I/O channel
Semiconductors; Test equipment
An input/output tester port that is capable of both stimulating a device pin and monitoring a response from the same pin.
open area
Semiconductors; Test equipment
An open and flat test site at which electromagnetic-interference measurements are taken and at which effects from power wires, buildings, and underground cables are negligible. ...
filter
Semiconductors; Test equipment
An operation that selectively removes noise from a signal. Electronic filters include low-pass, band-pass, and high-pass types. Mathematical filters can operate on data to extract ...
active test site
Semiconductors; Test equipment
An operational test site that has its tester channel numbers present in the test-programs pinlists. A multisite device test starts with all operational sites active. If a device ...
degradation
Semiconductors; Test equipment
An unwanted change in the performance of a system undergoing testing. A degradation is not necessarily a malfunction or failure.
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- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
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