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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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contrast
Semiconductors; Test equipment
A measure of brightness content in an image. High contrast implies mainly dark-black and bright-white content; low contrast implies a small spread of gray values.
sensitivity
Semiconductors; Test equipment
A measure of the minimum change in an input signal that an instrument can detect.
mismatch
Semiconductors; Test equipment
A non ideal coupling of two circuits. The part of the signal that does not pass through the coupling gets reflected and leads to measurement error.
site number
Semiconductors; Test equipment
A number that identifies a site location on the test head.
global system for mobile communications (GSM)
Semiconductors; Test equipment
A pan-European standard for digital cellular radio. Originally known as Groupe Spéciale Mobile.
crosstalk
Semiconductors; Test equipment
A phenomenon in which one or more signals interfere with another signal.
die
Semiconductors; Test equipment
A piece of semiconductor with circuitry fabricated on it; one location on a wafer; compare chip.
Sub-categories
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- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)