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Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

interrupt handler

Semiconductors; Test equipment

The software routine that handles an interrupt's request for service.

waveform

Semiconductors; Test equipment

The succession of signal levels applied to the DUT pin after combining pattern and timing information.

checksum

Semiconductors; Test equipment

The sum of a group of data values. Usually transmitted with the data to assist in error detection.

channel

Semiconductors; Test equipment

The tester functions and the path through a pin-group card and DUT fixture dedicated to one DUT pin.

cycle time

Semiconductors; Test equipment

The time duration from the start of one cycle to the start of the next.

conversion time

Semiconductors; Test equipment

The time required from the moment a channel is interrogated to the moment that accurate data is available. Usually associated with DACs and ADCs.

settling time

Semiconductors; Test equipment

The time required, after rapidly changing a circuit's input signal, for that circuit's output voltage to settle and remain within a specified error band around the final value.