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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment 
multiplexer-D (Mux-D)
Semiconductors; Test equipment
Type of scan design that uses D type flip-flops with input multiplexers to isolate each scan node. This is the most widely used type of scan element.
standard test data format (STDF)
Semiconductors; Test equipment
STDF is a standard output format for test results. There are numerous tools for post processing STDF generated files and performing statistical analysis on a population of tested ...
standard test interface language (STIL)
Semiconductors; Test equipment
STIL is an emerging standard for test development. It is supported as an output format by the ATPGs of most EDA toolsets. None of the ATEs currently support STIL directly, however ...
structural testing
Semiconductors; Test equipment
Strategy of testing integrated circuits that focuses on detecting manufacturing defects. Unlike functional or behavioral testing, defects are targeted directly.
self test using MISR and parallel SRSG (STUMPS)
Semiconductors; Test equipment
STUMPS is a common BIST architecture that combines a PRPG (or multiple SRSGs), multiple scan chains, and a MISR.
defect
Semiconductors; Test equipment
Term used to reference specific flaw(s); physical or chemical imperfection, on a manufactured device. Most defects can be detected and measured by a Failure Analysis group. ...
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- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
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