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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment 
return-to-zero (RZ)
Semiconductors; Test equipment
A digital wave format. When a valid bit is present, the waveform switches to a “1,” then back to a “0” within the same cycle.
supportability analyses (SA)
Semiconductors; Test equipment
A wide range of related analyses that should be conducted within the system’s engineering process. The goals of supportability analyses are to ensure that supportability is ...
surface barrier diode
Semiconductors; Test equipment
(Schottky diode) High speed diode that has very little junction capacitance. Also known as a "hot-carrier diode."
sandia controllability and observability analysis program (SCOAP)
Semiconductors; Test equipment
A method used to determine design testability; often used for scan or test point selection.
standard commands for programmable instruments (SCPI)
Semiconductors; Test equipment
An extension of the IEEE 488.2 standard defining standard programming commands and syntax for device operations.
silicon controlled rectifier (SCR)
Semiconductors; Test equipment
Three terminal active device that acts as a gated diode. The gate terminal is used to turn the device on allowing current to pass from cathode to anode.
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)