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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment 
small computer system interface (SCSI)
Semiconductors; Test equipment
(pronounced "scuzzy") An eight-bit parallel computer peripheral interface standard used to connect to a wide variety of peripherals devices including hard-disk and CD-ROM drives, ...
standard deviation (SD)
Semiconductors; Test equipment
A measure of the variability or dispersion of a distribution of scores. The most widely used measure of dispersion of a frequency distribution. It is equal to the positive square ...
scan data input (SDI)
Semiconductors; Test equipment
The Scan Data Input port on a scan cell -- more specifically, the assert side of the input multiplexor when the control signal, SE, is asserted.
scan data output (SDO)
Semiconductors; Test equipment
The dedicated Scan Data Output port on a scan cell, or the connection on the scan cell Q or QB output port used as a dedicated scan connection to another scan cell's SDI port.
scan enable (SE)
Semiconductors; Test equipment
The scan enable port on a scan cell and it's globally routed control signal -- this is the multiplexor control signal that selects whether the scan cell will update with data from ...
single-event effects (SEE)
Semiconductors; Test equipment
Associated with the change of states or transients in a device that energetic external radiation particles induce. You can classify SEEs into soft and hard errors. Soft errors are ...
serializer / deserializer (SERDES)
Semiconductors; Test equipment
An integrated circuit (IC or chip) transceiver that converts parallel data to serial data and vice-versa. The transmitter section is a serial-to-parallel converter, and the ...
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