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Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

single-event upsets (SEU)

Semiconductors; Test equipment

Soft errors in memory cells caused either by hardware problems, such as single event latch-ups (SELs) or by some external radiation.

spurious free dynamic range (SFDR)

Semiconductors; Test equipment

The ratio of the specified maximum signal level capability of the signal generator to its noise.

super high frequency (SHF)

Semiconductors; Test equipment

Frequency band between 3 GHz and 30 GHz. So desiganted by Federal Communications Comission (FCC).

system health management (SHM)

Semiconductors; Test equipment

The capability of monitoring real-time sensors to determine system health and performance.

safe high voltage (SHV)

Semiconductors; Test equipment

A type of connector used with BNC cables for safe connection to high voltage sources. The connector uses a bayonet mount similar to those of BNC connectors, but it is easily ...

single inline memory module (SIMM)

Semiconductors; Test equipment

Type of memory package used to increase memory density on the printed circuit board.

server I/O module (SIOM)

Semiconductors; Test equipment

An I/O module, designed for server and workstation applications, that uses PCI Express for communication.