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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment
design for automatic test pattern generation (DFATPG)
Semiconductors; Test equipment
The action of applying design rules to a chip design to ensure that an ATPG tool can successfully generate vectors and achieve a targeted quality level.
design for debug (DFD)
Semiconductors; Test equipment
Design-for-Debug. The use of on-chip instrumentation, with specialized EDA software, to detect, diagnose, and debug functional errors in SoC's.
design for manufacturing for integrated circuits (DFM for ICs)
Semiconductors; Test equipment
Achieving high-yielding designs in the state of the art, VLSI technology has become an extremely challenging task due to the miniaturization as well as the complexity of ...
design rules for test
Semiconductors; Test equipment
(DFT Rules) - The set of design restrictions placed on a design description for the test process. These rules are applied to ease the vector generation process (manual or ATPG); ...
design for testability (DFT)
Semiconductors; Test equipment
A philosophy and activity whereby the designer of a circuit takes into account the method used to test the circuit and designs the product in a manner which will reduce the cost ...
design for X (DFX)
Semiconductors; Test equipment
A generic name for the members of a family of methodologies adopted for improve the project and conception of a product for a determined objective (as cost, assembly facility, ...
design for yield (DFY)
Semiconductors; Test equipment
A Design for Manufacturing (DFM) technique which alters the design in a manner that is more likely to produce higher chip yields.
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)