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Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

electroencephalogram (EEG)
Semiconductors; Test equipment

An instrument used to make brain wave measurements.

electrically erasable programmable read-only memory (EEPROM)
Semiconductors; Test equipment

Pronounced double-ee-prom or e-e-prom, short for electrically erasable programmable read-only memory. EEPROM is a special type of PROM that can be erased by exposing it to an ...

equivalent focal length (EFL)
Semiconductors; Test equipment

The focal length of an infinitely thin lens having the same paraxial imaging properties as a thick lens or multiple-element system.

EJTAG
Semiconductors; Test equipment

EJTAG is a hardware/software subsystem that provides comprehensive debugging and performance tuning capabilities to MIPS® microprocessors and to system-on-a-chip components having ...

embedded logic test (ELT)
Semiconductors; Test equipment

A hierarchical test solution used to simplify the implementation of logic test for large chips. A logicTest controller is associated with each block module to perform an internal ...

electromagnetic disturbance (EMD)
Semiconductors; Test equipment

Any electromagnetic phenomenon that may degrade the performance of equipment and/or system. NOTE: An electromagnetic disturbance may be an electromagnetic noise, an unwanted ...

electromagnetic field (EMF)
Semiconductors; Test equipment

Condition produced in space by the joint interaction of oscillating electric and magnetic fields which move independently of the charges or poles from which they originate. Per ...

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