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Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

electromotive force (emf)
Semiconductors; Test equipment

Force that causes the motion of electrons due to potential difference between two points. (voltage)

electromagnetic interference (EMI)
Semiconductors; Test equipment

Any electromagnetic disturbance that interrupts, obstructs, or otherwise degrades or limits the effective performance of electronics/electrical equipment. It can be induced ...

electromagnetic pulse (EMP)
Semiconductors; Test equipment

A broadband, high-intensity, short-duration burst of electromagnetic energy. In the case of nuclear detonations, the electromagnetic pulse signal consists of a continuous spectrum ...

electromagnetic radiation (EMR)
Semiconductors; Test equipment

The emission of energy in the form of electromagnetic waves. It consists of oscillating electric and magnetic fields propagating at the speed of light. It includes gamma ...

electromagnetic vulnerability (EMV)
Semiconductors; Test equipment

The characteristics of electrical or electronic equipment/systems that cause it to suffer degradation or failure in performance as a result of electromagnetic interference.

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Semiconductors; Test equipment

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electrical overstress (EOS)
Semiconductors; Test equipment

Electrical OverStress is a transient or steady state electrical condition that exceeds the specifications and/or capabilities of a device. Both the magnitude and duration of an ...

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