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Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

loss of vehicle (LOV)
Semiconductors; Test equipment

The measurement of probability of a failure causing loss of vehicle, platform or equipment and is specified as a level 4 criticality in the FMECA.

hertz
Semiconductors; Test equipment

(lower-case h, but abbreviated Hz) The unit of frequency. Formerly cps for cycles per second.

logistics supports analysis (LSA)
Semiconductors; Test equipment

A systems engineering and design process selectively applied during all life cycle phases of the system/equipment to help ensure supportability objectives are met. (MIL-STD-1785)

logistics supports analysis record (LSAR)
Semiconductors; Test equipment

That portion of LSA documentation consisting of detailed data pertaining to the identification of logistic support resource requirements of an equipment.

large scale integration (LSI)
Semiconductors; Test equipment

Arrays of ICs on a single substrate that comprise 100 or more individual active circuit functions or gates.

long term evolution (LTE)
Semiconductors; Test equipment

The name given to a project within the Third Generation Partnership Project (3GPP) to improve the Universal Mobile Telecommunications System (UMTS) mobile phone standard to cope ...

LAN extensions for instrumentation (LXI)
Semiconductors; Test equipment

LAN-based successor to GPIB. it goes beyond GPIB to provide additional capabilities that make it easier for system designers and integrators to create faster, more efficient ...

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