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Semiconductors

Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.

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Semiconductors > Test equipment

phase

Semiconductors; Test equipment

(Of a periodic quantity), the fractional part of a period between a reference time (such as when displacement = zero) and a particular time of interest; or between two motions ...

orthogonal frequency division multiplexing (OFDM)

Semiconductors; Test equipment

Single high-frequency carrier is replaced by multiple subcarriers, each operating at a significantly lower frequency. It is a special method of multi-carrier modulation. Like all ...

operational maintenance

Semiconductors; Test equipment

(O-Level Maintenenace) - Maintenance in which the repair action consists of the removal and replacement of the malfunctioning assembly (LRU, black box, equipment). In both two and ...

on-chip emulation (OnCE)

Semiconductors; Test equipment

A Freescale JTAG command which makes a TAP enter a special mode where the IR holds OnCE debugging commands for operations such as single stepping, breakpointing, and accessing ...

operational amplifier (OpAmp)

Semiconductors; Test equipment

A high gain DC amplifier that has a high input impedance and a low output impedance. Op-amps are the most basic type of linear integrated circuits

operational verification (Op-Ver)

Semiconductors; Test equipment

Typically subsets of the performance tests. The purpose of operational verification tests is to verify instrument operation quickly with reasonable confidence. Operation ...