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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment 
personal area network (PAN)
Semiconductors; Test equipment
A term popularized to describe how Bluetooth enables a collection of personal electronic devices to operate together as a logical collective.
pipeline operation altering thread (PAT)
Semiconductors; Test equipment
A pre-compiled list of PC ImageFlow operations which define a particular collection of pipelined operations. PATs can be executed extremely quickly and are used to configure and ...
plastic ball grid array (PBGA)
Semiconductors; Test equipment
A ball grid array component whose package substrate is made of plastic, most likely an FR-4 equivalent of epoxy-fiberglass, polyimide-arramid, or similar resin-fiber combinations.
power-up BIT (PBIT)
Semiconductors; Test equipment
Comprehensive tests of hardware functionality extending as close to the edge of a module as possible.
positive bias temperature instability (PBTI)
Semiconductors; Test equipment
A failure mechanism in ICs that is similar to NBTI, except that it happens on a PFET rather than an NFET
printed circuit assembly (PCA)
Semiconductors; Test equipment
The generic term for a PCB after all electrical components have been attached. Also referred to as a printed wiring assembly (PWA).
printed circuit board (PCB)
Semiconductors; Test equipment
A part manufactured from a rigid base material upon which a completely processed printed circuit has been formed.
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)