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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment 
peripheral component interconnect (PCI)
Semiconductors; Test equipment
A high-performance expansion bus architecture originally developed by Intel to replace ISA and EISA. It is achieving widespread acceptance as a standard for PCs and workstations; ...
pulse code modulation (PCM)
Semiconductors; Test equipment
Method of modulation in which analog voice signals are sampled and converted to digital words that are then transmitted serially. Most PCM systems use either 7- or 8-bit binary ...
personal computer memory card international association (PCMCIA)
Semiconductors; Test equipment
A credit card-size device originally designed as a platform for add-on memory for portable computers, but later expanded to include a wide range of peripherals including pagers ...
personal communication system (PCS)
Semiconductors; Test equipment
PCs is a new lower power high frequency competitive technology to cellular operating at 1.5 to 1.8 Ghz range. It is usually associated with cordless telephone-like devices and PDA ...
personal digital assistant (PDA)
Semiconductors; Test equipment
PDAs are primarily a productivity and communications tool that is lightweight, compact, durable, reliable, easy to use, and integrates into existing operations. PDAs fall into ...
plan-do-check-act (PDCA)
Semiconductors; Test equipment
This is a basic principle followed for effective problem solving during kaizen.
probability density function (PDF)
Semiconductors; Test equipment
A mathematical model that describes the probability of failure ocurring over time. This function can be utilized to determine the probability that a failure takes place in a given ...
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)