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Semiconductor quality

Contributors in Semiconductor quality

Semiconductor quality

RAM (random access memory)

Semiconductors; Semiconductor quality

A storage device in which the ability to access a randomly selected bit of stored data is independent of either the timing of the most recent access of that bit or the location of the most recently ...

read-and-record

Semiconductors; Semiconductor quality

The recording, by individual device serial number, of the actual parametric values measured for that device at a specific electrical test point. Read-and-record can be done for device ...

rebonding

Semiconductors; Semiconductor quality

The placement of a new bond on the same pad or post as a previously attempted bond. If the original bond has been removed, the new bond is still considered a rebond. A bond-off, that is, an extra ...

reject number

Semiconductors; Semiconductor quality

For a sample test, the number of failed devices which will cause lot rejection. This will normally be one higher than the accept number.

reliability

Semiconductors; Semiconductor quality

The anticipated lifetime of a device, how long it can be expected to "survive" in the user's system. This is normally defined as a failure rate (percent per 1000 hours) or as an MTBF (Mean Time ...

resistance to solvents

Semiconductors; Semiconductor quality

A test which requires immersion of sample devices in such solvents as trichlorotrifluoroethane and methylene chloride, followed by brushing to determine the durability of unit marking.

rel electrical test specification (RETS)

Semiconductors; Semiconductor quality

A one page document used by National Semiconductor to detail the actual electrical testing for a given military device type.

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