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Semiconductor quality

Contributors in Semiconductor quality

Semiconductor quality

triboelectric effects

Semiconductors; Semiconductor quality

The creation of electrostatic charge that occurs when two surfaces contact and then separate, leaving one positively charged and the other negatively charged.

burn-in

Semiconductors; Semiconductor quality

The application of electrical biases to a device while operating it at an elevated temperature (usually 125°C), normally as a 100% screening test. Standard burn-in durations are 160 hours for Class B ...

trim and form

Semiconductors; Semiconductor quality

The step in the assembly process for devices assembled on a lead frame (such as flatpacks and dual-in-line packages) where the lead frame is trimmed off and the leads bent or formed into their ...

burst radiation

Semiconductors; Semiconductor quality

Large amounts of rapid dose rate ionizing radiation [normally in excess of 108 rads (Si)/sec] resulting in device latch-up, data upset, threshold shift or other performance degradation. Burst ...

truth table

Semiconductors; Semiconductor quality

For a logic device, a table showing the output logic states that would result from each of the possible input logic combinations the device is designed to accept.

CAD (computer aided design)

Semiconductors; Semiconductor quality

The use of computer automation in the implementation of all or a portion of a design for a complex circuit.

ultra large scale integration (ULSI)

Semiconductors; Semiconductor quality

A term applied to devices with complexity levels in excess of 10,000 gates.

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