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Test equipment

Contributors in Test equipment

Test equipment

range

Semiconductors; Test equipment

(1) The maximum and minimum allowable full-scale signal (input or output) that yields a specified performance level.

built in self test (BIST)

Semiconductors; Test equipment

BIST essentially builds tiny tester models onto the integrated circuit so that it can test itself.

defect based test (DBT)

Semiconductors; Test equipment

Test development philosophy (mind set) that begins by looking at the fab's defect densities, the circuit layout and the creating test sets that will uncover the defects most likely to affect the ...

design for test (DFT)

Semiconductors; Test equipment

Design For Test is the practice of adding hardware hooks to integrated circuits in order to facilitate effective, inexpensive testing.

lot

Semiconductors; Test equipment

In device production, a group of semiconductor devices, usually from the same production run, treated as a unit.

direct memory access (DMA)

Semiconductors; Test equipment

With respect to test, DMA refers to an architecture that allows direct addressability and observability of embedded memories.

level sensitive scan design (LSSD)

Semiconductors; Test equipment

Type of scan design that uses master/slave latches which have different clock phases to isolate each scan node.

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