Home > Industry/Domain > Semiconductors > Test equipment

Test equipment

Contributors in Test equipment

Test equipment

clock data and recovery (CDR)

Semiconductors; Test equipment

Some digital data streams, especially high-speed serial data streams (such as the raw stream of data from the magnetic head of a disk drive) are sent without an accompanying clock. The receiver ...

Comité Européen de Normalisation Electrotechnique (CENELEC)

Semiconductors; Test equipment

Comité Européen de Normalisation Electrotechnique (European Committee for Electrotechnical Standardization), located in Brussels, in charge of harmonizing electro-technical standards in the frame of ...

CAD framework initiative (CFI)

Semiconductors; Test equipment

A consortium of EDA tool companies tasked with the development of framework standards for EDA tools.

column grid array (CGA)

Semiconductors; Test equipment

A packaging technology similar to a pad grid array, in which a device's external connections are arranged as an array of conducting pads on the base of the package. However, in the case of a column ...

complex instruction set computer (CISC)

Semiconductors; Test equipment

A design approach for microprocessors and microcontrollers which employs relatively complex instructions that execute over multiple clock cycles. A program written using CISC instructions requires ...

circuit mil area (CMA)

Semiconductors; Test equipment

A unit of area equal to the area of a circle whose diameter is one mil (0.001 inch). Used chiefly in specifying cross-sectional areas of conductors.

component maturity model integration (CMMI)

Semiconductors; Test equipment

A software development standard spearheaded by the Department of Defense (DoD) to improve the quality of the software developed by its contractors.

Featured blossaries

Russian Actors

Category: Arts   1 20 Terms

American Library Association

Category: Culture   1 16 Terms