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Test equipment

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Test equipment

complementary metal oxide semiconductor (CMOS)

Semiconductors; Test equipment

A family of integrated circuits characterized by low power consumption.

common mode rejection ratio (CMRR)

Semiconductors; Test equipment

A measure of an instrument's ability to ignore or reject interference from a signal that is common to the instrument's input terminals, but relative to ground. (Expressed in decibels.)

chip mount technology (CMT)

Semiconductors; Test equipment

Any packaging or electronic assembly manufacturing technology, such as TOB, COB, or flip chip, that connects bare (unpackaged) IC chips to the substrate.

capacitance measurement unit (CMU)

Semiconductors; Test equipment

This is a very generic term covering any sort of hardware that can perform capacitance measurement.

cannot duplicate (CND)

Semiconductors; Test equipment

A fault indicated by BIT or other monitoring circuitry which cannot be confirmed at the first level of maintenance.

chip on board (COB)

Semiconductors; Test equipment

A configuration in which a chip is directly attached to a printed circuit board or substrate by solder or conductive adhesives.

chip-on-board (COB)

Semiconductors; Test equipment

A situation where the silicon IC chip is mounted directly to the electronic assembly substrate or PWB without an intermediate packaging step. Connections between the chip and the board are generally ...

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