18 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
core test language (CTL)
Semiconductors; Test equipment
Extensions to IEEE standard 1450 (STIL) to address test aspects of cores.
digital to analog (D/A) converter (DAC)
Semiconductors; Test equipment
An electronic device, which takes input information in digital form and converts it to an analog output containing the same information.
decibel microvolt (dBµV)
Semiconductors; Test equipment
Absolute voltage level referred to 1 µV (0 dBµV = 1 µV)
decibel noise (dBa0)
Semiconductors; Test equipment
Noise power measured at zero transmission level point.
decibel carrier level (dBc/Hz)
Semiconductors; Test equipment
Level difference referred to carrier level calculated for a measurement bandwidth of 1 Hz. (Spectrum and network analysis.)
