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Test equipment

Contributors in Test equipment

Test equipment

core test language (CTL)

Semiconductors; Test equipment

Extensions to IEEE standard 1450 (STIL) to address test aspects of cores.

digital to analog (D/A) converter (DAC)

Semiconductors; Test equipment

An electronic device, which takes input information in digital form and converts it to an analog output containing the same information.

decibel microvolt (dBµV)

Semiconductors; Test equipment

Absolute voltage level referred to 1 µV (0 dBµV = 1 µV)

decibel noise (dBa0)

Semiconductors; Test equipment

Noise power measured at zero transmission level point.

decibel carrier level (dBc/Hz)

Semiconductors; Test equipment

Level difference referred to carrier level calculated for a measurement bandwidth of 1 Hz. (Spectrum and network analysis.)

decibel voltage (dBm V)

Semiconductors; Test equipment

dB referred to 1 millivolt across 75 ohms

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