Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

bipolar junction transistor (BJT)

Semiconductors; Test equipment

A three terminal device in which emitter to collector current is controlled by base current.

board level self-test (BLST)

Semiconductors; Test equipment

A form of BIT or BIST specifically targeting the functionality of the board in which the BLST resides.

bill of material (BOM)

Semiconductors; Test equipment

comprehensive listing of all subassemblies, components, and raw materials that go into a parent assembly, showing the quantity of each required to make the assembly.

beacon period occupancy information element (BPOIE)

Semiconductors; Test equipment

Contained in the payload of every beacon frame, the BPOIE reports the BP length and status of individual slots as seen by the device transmitting the frame. The slot info bitmap field communicates or ...

bits per second (BPS)

Semiconductors; Test equipment

Used to denote the speed of data transfer. Used interchangable with "baud" in most cases.

basic rate interface (BRI)

Semiconductors; Test equipment

Basic Rate ISDN. Services targeted at home and small business users. BRI service is delivered over a single twisted pair, the same wiring that is used to deliver POTS. It includes three fully duplex ...