Test equipment

Test equipment

Industry: Semiconductors

Add a new term

Contributors in Test equipment

Become a Contributors

Test equipment

basic input/output system (BIOS)

Semiconductors; Test equipment

BIOS functions are the fundamental level of any PC or compatible computer. BIOS functions embody the basic operations needed for successful use of the computer’s hardware resources.

built-In repair analysis (BIRA)

Semiconductors; Test equipment

Technique used to determine if a memory is repairable and the repair information based on the specified redundancy scheme, i.e., spare IO or column, or spare row.

build-in self analysis (BISA)

Semiconductors; Test equipment

A method related to Built-in Self Repair (BISR) that processes memory failure data to generate repair data.

built-In self repair (BISR)

Semiconductors; Test equipment

A memory repair method that goes beyond diagnostics to actually repair the device through redundancy selection when defects are detected.

built In test (BIT)

Semiconductors; Test equipment

An integral capability of the mission system or equipment which provides an automated test capability to detect, diagnose or isolate failures.

built-In test (BIT)

Semiconductors; Test equipment

An internal automatic or semiautomatic feature in a system or subsystem designed to detect, diagnose or isolate system failures by interrogating a system or monitoring system performance.