Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

computer aided engineering (CAE)

Semiconductors; Test equipment

The original term for electronic design automation (EDA). Now, often refers to the software tools used to develop the manufacturing tooling for the production of electronic systems such as for the ...

content addressable memory (CAM)

Semiconductors; Test equipment

A memory that responds to the input of a particular data pattern by giving back the location of that data. This is the inverse of a RAM (Random Access Memory) that writes and reads data to and from ...

shadow logic

Semiconductors; Test equipment

User defined logic (UDL) accessible only from the input/output ports of an embedded core (i.e.. IP). The core is said to cast a shadow which potentially reduces the testability of the logic in that ...

multisite testing

Semiconductors; Test equipment

Using a single test program and a single test head with more than one test site to test more than one device either in parallel or in sequence. The sequential test of two or more devices is called a ...

multidie probing

Semiconductors; Test equipment

Using probes on several dice on a wafer to conduct a parallel test of more than one die at a time.

false accept

Semiconductors; Test equipment

When faulty circuits operate within test thresholds, a test program can pass them when they should in fact be rejected. False acceptance happens when fault occurs within the upper threshold of faulty ...

false reject

Semiconductors; Test equipment

When thresholds are tighter than they need to be, fault-free circuits can be rejected because they fall outside of narrowly defined limits for nominal value.