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Test equipment

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Test equipment

synchronous

Semiconductors; Test equipment

(1)A signal whose data is not acknowledged or acted upon until the next active edge of a clock signal. (2)A system whose operation is synchronized by a clock signal.

dielectric layer

Semiconductors; Test equipment

(1)An insulating layer used to separate two signal layers. (2)An insulating layer used to modify the electrical characteristics of an MCM-D substrate

half digit resolution

Semiconductors; Test equipment

(1/2 digit) - The 1/2 or "half" in describing the resolution of an instrument to make it 3 1/2 digit or 4 1/2 has a mysterious origin. Conventional wisdom has it that it refers to the front digit, ...

third generation (3G)

Semiconductors; Test equipment

The next generation of wireless technology beyond personal communications services. The World Administrative Radio Conference assigned 230 megahertz of spectrum at 2 GHz for multimedia 3G networks. ...

Third Generation Partnership Project (3GPP)

Semiconductors; Test equipment

a collaboration between groups of telecommunications associations, to make a globally applicable third generation (3G) mobile phone system specification within the scope of the International Mobile ...

ampere (A)

Semiconductors; Test equipment

A unit of electrical current.

ampere per meter (A/m)

Semiconductors; Test equipment

Ampere per metre (unit of magnetic field strength)

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