Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

antenna factor (AF)

Semiconductors; Test equipment

The term (AF) is used to define the antenna calibration relationship required for making accurate radiated emission measurements. The unknown electric field strength (E in V/m) is obtained by ...

arbitrary function generator (AFG)

Semiconductors; Test equipment

The arbitrary/function generator (AFG) serves a wide range of stimulus needs; in fact, it is the prevailing signal generator architecture in the industry today. Typically, this instrument offers ...

advanced graphics port (AGP)

Semiconductors; Test equipment

A higher-speed version of the PCI bus using a different connector. Developed to accommodate the bandwidth needs of dedicated plug-in graphics cards in desktop PCs.

The ratio of operational “up time” to “down time” measured as MTBF over MTBF + MTTR. AI is based on the capability of the design to perform reliably (MTBF) and, in case of failure, the time required ...

four-terminal resistance measurement

Semiconductors; Test equipment

A measurement where two leads supply current to the unknown resistance and two different leads sense the voltage drop across it.

kelvin measurement

Semiconductors; Test equipment

A measurement where two leads supply current to the unknown resistance and two different leads sense the voltage drop across it.

protocol analyzer

Semiconductors; Test equipment

Software programs (usually) or computer hardware that can intercept and log traffic passing over a digital network or part of a network. As data streams travel back and forth over the network, the ...