Test equipment

Test equipment

Industry: Semiconductors

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Semiconductors; Test equipment

1. (scan) The data fed to a scan pin on one scan clock cycle Ñ the scan equivalent of a parallel vector.

vector

Semiconductors; Test equipment

1. A parallel vector is the functional logic applied to a DUT during one clock cycle.

validation

Semiconductors; Test equipment

A "post-silicon" process to prove (with evidence) a design to be valid. For our purposes, validation is any use of special purpose test hardware to prove the product meets the design intent; as ...

verification

Semiconductors; Test equipment

A "pre-silicon" process done during development, for gaining confidence, that a Design will produce a pre-defined result. An output of verification may be translated into ATE vectors (used for ...

national television system committee (NTSC)

Semiconductors; Test equipment

A 60-Hz standard for encoding color video signals. The standard is used in North America, Canada, Japan, and most of South America.

butterfly

Semiconductors; Test equipment

A basic math operation that forms part of a fast Fourier transform algorithm. Memory test pattern.

built-in logic block observer (BILBO)

Semiconductors; Test equipment

A BILBO is a multitalented logic circuit that can be a state register, a scan register, an LFSR, or a MISR depending on the state of it's mode pins. BILBOs are sometimes used to cascade large ...