Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

path delay

Semiconductors; Test equipment

Fault characterized by a particular logic path being too slow to meet the overall timing requirements of a circuit.

Form of scan test application, where only the sample interval is required at the specified operating frequency in order to verify timing performance, as well as structural content. The scan data may ...

at-speed scan

Semiconductors; Test equipment

Form of scan where both the data shift and sample occur at the rated frequency of operation. Structure and timing performance can both be verified with this kind of scan test.

DC scan

Semiconductors; Test equipment

Form of scan where shifting and sampling occurs well below the devices normal operating frequency. This type of scan is effective for a 'pure' structural approach (i.e. for stuck-at faults) and, in ...

data acquisition (DAQ)

Semiconductors; Test equipment

Gathering information from sources such as sensors and transducers.

boundary scan

Semiconductors; Test equipment

Generic term for IEEE 1149.1. It is a methodology allowing complete controllability and observability of the boundary (I/O) pins via a standard interface. (AKA JTAG)