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Test equipment
Industry: Semiconductors
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Test equipment
primary output
Semiconductors; Test equipment
Physical output to the outside world from a device, can be a signal output, a scan chain output, etc. (Note: In the case of cores in an SOC, the outside world may still be inside the chip).
fault coverage
Semiconductors; Test equipment
Quality measure for a test or set of tests, based on the percentage of actually detected faults (defects) versus the total number of theoretically detectable faults, on a particular fault model. A ...
IDDQ
Semiconductors; Test equipment
Quiescent Supply Current (IDD). Theoretically, static CMOS logic should have nearly zero current when the clock is stopped. This methodology puts the chip into various logic states, stops the clock ...
blooming
Semiconductors; Test equipment
Saturation of light-sensing elements in a TV camera. Blooming causes clipping at the camera's maximum brightness level.
full scan
Semiconductors; Test equipment
Scan architecture (implementation) where all of the memory elements (flip-flops) are scannable in the design.
partial scan
Semiconductors; Test equipment
Scan architecture (implementation) where only some of the storage elements (flip-flops) are scannable.
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