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Test equipment

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Test equipment

primary output

Semiconductors; Test equipment

Physical output to the outside world from a device, can be a signal output, a scan chain output, etc. (Note: In the case of cores in an SOC, the outside world may still be inside the chip).

fault coverage

Semiconductors; Test equipment

Quality measure for a test or set of tests, based on the percentage of actually detected faults (defects) versus the total number of theoretically detectable faults, on a particular fault model. A ...

IDDQ

Semiconductors; Test equipment

Quiescent Supply Current (IDD). Theoretically, static CMOS logic should have nearly zero current when the clock is stopped. This methodology puts the chip into various logic states, stops the clock ...

multisite

Semiconductors; Test equipment

Refers to more than one test site on a single test head.

blooming

Semiconductors; Test equipment

Saturation of light-sensing elements in a TV camera. Blooming causes clipping at the camera's maximum brightness level.

full scan

Semiconductors; Test equipment

Scan architecture (implementation) where all of the memory elements (flip-flops) are scannable in the design.

partial scan

Semiconductors; Test equipment

Scan architecture (implementation) where only some of the storage elements (flip-flops) are scannable.

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