Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

averaging

Semiconductors; Test equipment

Mathematically smoothing the results of several measurements by adding them and dividing by the number of samples.

cross modulation

Semiconductors; Test equipment

Modulation of a desired signal by an undesired signal. This is a special case of inter modulation.

joint test action group (JTAG)

Semiconductors; Test equipment

Originally, the name of the team, through a not uncommon twist of fate, the term has come to be associated with the output of the team. JTAG is now essentially synonymous with the IEEE 1149.1 ...

file name

Semiconductors; Test equipment

Part of the identification used to locate a file on a volume.

test access port (TAP)

Semiconductors; Test equipment

Part of the JTAG standard, the TAP is a 4 (or optionally 5) pin port to enable boundary scan.

concurrent test

Semiconductors; Test equipment

Performing different tests simultaneously to one or more devices. For instance, you might be testing different BIST circuits simultaneously on the same chip. Alternatively, you might be testing ...

primary input

Semiconductors; Test equipment

Physical input from the outside world to a device, can be a signal input, a scan chain input, etc. (Note: In the case of cores in an SOC, the outside world may still be inside the chip).