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Test equipment

Contributors in Test equipment

Test equipment

stimulus

Semiconductors; Test equipment

An input signal which imitates action or reaction in a circuit, such as voltage or current.

I/O channel

Semiconductors; Test equipment

An input/output tester port that is capable of both stimulating a device pin and monitoring a response from the same pin.

open area

Semiconductors; Test equipment

An open and flat test site at which electromagnetic-interference measurements are taken and at which effects from power wires, buildings, and underground cables are negligible. Ambient radiation must ...

filter

Semiconductors; Test equipment

An operation that selectively removes noise from a signal. Electronic filters include low-pass, band-pass, and high-pass types. Mathematical filters can operate on data to extract information and to ...

active test site

Semiconductors; Test equipment

An operational test site that has its tester channel numbers present in the test-programs pinlists. A multisite device test starts with all operational sites active. If a device fails, its site is ...

array

Semiconductors; Test equipment

An ordered arrangement of information.

degradation

Semiconductors; Test equipment

An unwanted change in the performance of a system undergoing testing. A degradation is not necessarily a malfunction or failure.

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