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Test equipment

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Test equipment

contrast

Semiconductors; Test equipment

A measure of brightness content in an image. High contrast implies mainly dark-black and bright-white content; low contrast implies a small spread of gray values.

sensitivity

Semiconductors; Test equipment

A measure of the minimum change in an input signal that an instrument can detect.

mismatch

Semiconductors; Test equipment

A non ideal coupling of two circuits. The part of the signal that does not pass through the coupling gets reflected and leads to measurement error.

site number

Semiconductors; Test equipment

A number that identifies a site location on the test head.

global system for mobile communications (GSM)

Semiconductors; Test equipment

A pan-European standard for digital cellular radio. Originally known as Groupe Spéciale Mobile.

crosstalk

Semiconductors; Test equipment

A phenomenon in which one or more signals interfere with another signal.

die

Semiconductors; Test equipment

A piece of semiconductor with circuitry fabricated on it; one location on a wafer; compare chip.

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