15 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
memory built in self test (MBIST)
Semiconductors; Test equipment
BIST approach that is specific to memory testing.
false color
Semiconductors; Test equipment
Color added to an image to call attention to details that aren't readily perceptible or to create special effects.
sink current (active load)
Semiconductors; Test equipment
Conventional current flow into a DUT with the active load as pull-up.
source current (active load)
Semiconductors; Test equipment
Conventional current flow out of a DUT with the active load as pull-down.
design for manufacturing (DFM)
Semiconductors; Test equipment
Term used to define activities done during the design process (by Designers) to ensure that the design is optimized for the Fab Process that will create the product.
device under test (DUT)
Semiconductors; Test equipment
This is the target device being tested. Less frequently referred to as "CUT" (circuit under test).
wrap I/O
Semiconductors; Test equipment
DFT technique where a pin's output is wrapped back in to it's input (or the input of another pin). This can allow some testing of pins that are not contacted directly by the tester. Note: This ...
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