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Test equipment
Industry: Semiconductors
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Test equipment
though beyond the scope of this glossary.
Semiconductors; Test equipment
DFT technique where a pin's output is wrapped back in to it's input (or the input of another pin). This can allow some testing of pins that are not contacted directly by the tester. Note: This ...
pogo pin
Semiconductors; Test equipment
A kind of spring-loaded pin formed of two small tubular sections joined together with an internal spring and with a contactor formed on the end of the smaller tube; used to contact pads on a circuit ...
decibel (dB)
Semiconductors; Test equipment
A logarithmic measure of the ratio of two signal levels: dB = 20 log (Voltage1 / Voltage2) dB = 10 log (Power1 / Power2)Variants on the decibel (dB) used in spectrum-analysis and ...
discrete cosine transform
Semiconductors; Test equipment
A mathematical operation that compresses video data in JPEG and MPEG files.
cyclic redundancy check (CRC)
Semiconductors; Test equipment
A mathematically generated number that data receivers use to verify the proper bit arrangement in a bit stream.
common-mode rejection ratio (CMRR)
Semiconductors; Test equipment
A measure of an instrument's ability to ignore or reject interference from a signal that is common to the instrument's input terminals, but relative to ground. (Expressed in decibels.)
