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Test equipment

Contributors in Test equipment

Test equipment

wafer map

Semiconductors; Test equipment

A plot of the viable dice on a wafer showing pass/fail information, parameter variation, or some other characteristic.

functional test

Semiconductors; Test equipment

A process that applies pattern vectors to a device and checks the output to determine that the device is operating according to its truth table.

spooler

Semiconductors; Test equipment

A process that queues jobs for background printing (or other tasks).

debugger

Semiconductors; Test equipment

A process used for test-program development, device characterization, incoming inspection, and production-floor trouble shooting.

coprocessor

Semiconductors; Test equipment

A processor that operates with the CPU to boost speed. For example, a digital signal processing (DSP) chip can free the CPU from having to perform repetitious math operations.

firmware

Semiconductors; Test equipment

A program permanently recorded in ROM; it is effectively a piece of hardware that performs software functions.

cross assembler

Semiconductors; Test equipment

A program that runs on one computer and generates instructions for another type of computer.

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