19 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
wafer map
Semiconductors; Test equipment
A plot of the viable dice on a wafer showing pass/fail information, parameter variation, or some other characteristic.
functional test
Semiconductors; Test equipment
A process that applies pattern vectors to a device and checks the output to determine that the device is operating according to its truth table.
spooler
Semiconductors; Test equipment
A process that queues jobs for background printing (or other tasks).
debugger
Semiconductors; Test equipment
A process used for test-program development, device characterization, incoming inspection, and production-floor trouble shooting.
coprocessor
Semiconductors; Test equipment
A processor that operates with the CPU to boost speed. For example, a digital signal processing (DSP) chip can free the CPU from having to perform repetitious math operations.
firmware
Semiconductors; Test equipment
A program permanently recorded in ROM; it is effectively a piece of hardware that performs software functions.
cross assembler
Semiconductors; Test equipment
A program that runs on one computer and generates instructions for another type of computer.
