4 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
composite video
Semiconductors; Test equipment
A signal composed of luminance (black and white),chrominance (color), blanking pulses, sync pulses, and a color-burst signal.
strobe
Semiconductors; Test equipment
A signal that clocks a logic state into a latch or D flip flop. In a semiconductor test, an edge strobe records a comparison result at a specified instant in the cycle; a window strobe records any ...
interrupt
Semiconductors; Test equipment
A signal that requires immediate attention from a computer's CPU.
shift register sequence generator (SRSG)
Semiconductors; Test equipment
A simple PRPG (single output) defined here because it's used in the definition of STUMPS.
I/O address
Semiconductors; Test equipment
A specific hardware circuit and software value that the CPU uses to distinguish between the different boards in a system.
Java
Semiconductors; Test equipment
A subset of the C++ language specifically meant for running applications on the Web.
surge
Semiconductors; Test equipment
A sudden change (usually an increase) in the voltage on a powerline. A surge is similar to a spike, but it lasts longer.
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