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Test equipment
Industry: Semiconductors
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Test equipment
wafer
Semiconductors; Test equipment
A thin, polished slice of monolithic semiconductor on which an array of die are fabricated.
spike
Semiconductors; Test equipment
A transient disturbance of an electrical circuit caused by, for example, load variations on the AC power line.
edge-placement accuracy
Semiconductors; Test equipment
The precision within which an edge can be placed relative to a reference.
seebeck effect
Semiconductors; Test equipment
The principle that describes how thermocouples work. A thermocouple circuit contains two junctions of two dissimilar metals.
cyclization
Semiconductors; Test equipment
The process by which discrete time signals (such as supplied in VCD) are mapped to a representation amenable to automatic test equipment.
amplitude modulation
Semiconductors; Test equipment
The process in which the amplitude of a carrier wave is varied according to a specific law.
analog-to-digital conversion
Semiconductors; Test equipment
The process that changes an analog signal into a digital magnitude value.
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