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Test equipment
Industry: Semiconductors
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Test equipment
data reduction
Semiconductors; Test equipment
The transformation of raw data, such as that logged during a device-test run, to human-usable forms, such as graphical representations and tables.
brightness
Semiconductors; Test equipment
The value associated with a pixel that represents a gray value between black and white.
ambient level
Semiconductors; Test equipment
The values of signals and noise that exist at a test location when the device under test is not active.
compliance voltage
Semiconductors; Test equipment
The voltage range a current source or sink can produce within its constant current specifications.
isolation voltage
Semiconductors; Test equipment
The voltage that an isolated circuit can normally withstand. Isolation voltage is specified from input to input or from any input to the amplifier output.
aliasing
Semiconductors; Test equipment
There are a number of different kinds of aliasing that can occur in BIST engines. The most commonly discussed type of aliasing occurs when two faults have a canceling effect in the signature ...