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Test equipment

Contributors in Test equipment

Test equipment

data reduction

Semiconductors; Test equipment

The transformation of raw data, such as that logged during a device-test run, to human-usable forms, such as graphical representations and tables.

brightness

Semiconductors; Test equipment

The value associated with a pixel that represents a gray value between black and white.

ambient level

Semiconductors; Test equipment

The values of signals and noise that exist at a test location when the device under test is not active.

compliance voltage

Semiconductors; Test equipment

The voltage range a current source or sink can produce within its constant current specifications.

isolation voltage

Semiconductors; Test equipment

The voltage that an isolated circuit can normally withstand. Isolation voltage is specified from input to input or from any input to the amplifier output.

aspect ratio

Semiconductors; Test equipment

The width-to-height ratio of a video picture.

aliasing

Semiconductors; Test equipment

There are a number of different kinds of aliasing that can occur in BIST engines. The most commonly discussed type of aliasing occurs when two faults have a canceling effect in the signature ...

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