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Test equipment

Contributors in Test equipment

Test equipment

sink voltage (active load)

Semiconductors; Test equipment

Terminal voltage at a DUT acting as current sink.

source voltage (active load)

Semiconductors; Test equipment

Terminal voltage at a DUT acting as current source.

operational test sites

Semiconductors; Test equipment

Test sites on a multisite test head declared on to the test program. This assures that a test site is usableÑno broken socket, channel runs exist. An operator can declare test sites non-operational.

automatic pattern generator (APG)

Semiconductors; Test equipment

Tester resource that generates vectors on-the-fly, programmatically (algorithmically) , usually for memory test.

parallel test

Semiconductors; Test equipment

Testing more than one device simultaneously. By convention, this is usually assumed to be identical tests on identical devices. (contrast to Concurrent Test).

diagnostic tests

Semiconductors; Test equipment

Tests intended to determine the cause of a possible malfunction and to suggest a repair strategy.

shutdown

Semiconductors; Test equipment

The (usually graceful) termination of operation-system execution on a processor (or system of processors).

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